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Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111
Figure 1: AFM assembly and integration inside a Zeiss ORION NanoFab helium ion microscope. a) Simplified CAD ...
Figure 2: Correlative imaging in process on silicon pillars. a) Optical image showing how the AFM cantilever ...
Figure 3: AFM height images of poly(methyl methacrylate) after exposure to a) 1 × 1013 and b) 3 × 1013 He ion...